Bruce A. Crawford
Geen lopende functies
Profiel
Bruce A.
Crawford served as the Chief Operating Officer at Nanometrics, Inc. from 2006 to 2014 and as the President & Chief Operating Officer at Accent Optical Technologies, Inc. from 2000 to 2007.
He received his undergraduate degree from De Anza College.
Eerdere bekende functies van Bruce A. Crawford
| Bedrijven | Functie | Einde |
|---|---|---|
| ONTO INNOVATION INC. | Operationeel Directeur | 26-12-2014 |
Accent Optical Technologies, Inc.
 Accent Optical Technologies, Inc. Electronics DistributorsDistribution Services Accent Optical Technologies supllies process control tools for optoelectronic, wireless and silicon semiconductor manufacturers worldwide. Its portfolio of products include: Critical Dimension and Scatterometry, Defect Detection, Pulsed Current Analysis, DLTS, Electrochemical CV Profiling, FT-IR, Hall Mobility System, Overlay, PL Mapping; X-ray Diffraction and Contamination Mapping. It was founded in July, 2000 and is headquartered in Bend, OR | President | 11-10-2007 |
Opleiding van Bruce A. Crawford
| De Anza College | Undergraduate Degree |
Ervaring
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Beursgenoteerde bedrijven
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Bedrijven verbonden in de eerste graad
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Verwante bedrijven
| Bedrijven in privébezit | 2 |
|---|---|
Nanometrics, Inc.
 Nanometrics, Inc. Electronic Production EquipmentElectronic Technology Nanometrics, Inc. engages in the production of process control metrology and inspection systems used in the fabrication of semiconductors and other solid-state devices. The firm operates through the following geographical segments: South Korea; China; Singapore; United States; Taiwan; Japan; and Others. Its products and solutions include semiconductor; data storage; advanced packaging; HB-LED; solar photovoltaic; and product upgrades. The company was founded by Vincent J. Coates in 1975 and is headquartered in Milpitas, CA. | Electronic Technology |
Accent Optical Technologies, Inc.
Accent Optical Technologies, Inc. Electronics DistributorsDistribution Services Accent Optical Technologies supllies process control tools for optoelectronic, wireless and silicon semiconductor manufacturers worldwide. Its portfolio of products include: Critical Dimension and Scatterometry, Defect Detection, Pulsed Current Analysis, DLTS, Electrochemical CV Profiling, FT-IR, Hall Mobility System, Overlay, PL Mapping; X-ray Diffraction and Contamination Mapping. It was founded in July, 2000 and is headquartered in Bend, OR | Distribution Services |
